Beam Induced Fluorescent(BIF) Profile Monitor

Beam Induced Fluorescence is a common non-destructive profile instrument, which has totally none inserted component and great applications in the LINAC or accelerator regions with gas injection. In theory, the residual gas molecules can be motivated from the Ground-state to the Excited- state by the energy transfer of the beam particles. Then the fluorescence gets emitted during the deexcitation of gas molecules fast inside hundreds of nanoseconds. The photo yield also has positive correlation with the beam density and the real profile distribution can be reconstructed.

BIF profile raw image prcessed by Labview


BIF profile raw picture and measurement benchmark with a wire scanner


BIF in CSRm

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