Beam Feedback and Machine Protection

Ionization Profile Monitor(IPM)

Ionization Profile Monitor is one of the most popular non-invasive profile instruments, which is especially suitable for the proton and heavy ion facility. In principle, a certain number of ionization products firstly originate from the Coulomb interaction between the charged beam particles and residual gas molecules. Then the signal particles (residual gas ions or electrons) are driven by a homogeneous strong electrostatic field to reach the Micro Channel Plates (MCP), where the signals are multiplied and subsequently transferred to the collecting anode or phosphor screen. The signal is positively proportional to the density of beam particles and the real transverse profile can be retrieved.

IPM Measurement result


IPM structure

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